Event Invitation
Welcome to Join Smart Cars and IoV Key Technologies Seminar
DEKRA will Analyze the New Trend of Automotive Testing and Certification Under 5G and IoV Tendency
DEKRA Taiwan is invited to analyze the "New Trend of Automotive Testing and Certification Under 5G and IoV Tendency" on "Smart Cars and IoV Key Technologies Seminar" held by Micro-Electronics Magazine on September 3rd in NTUH International Convention Center in Taipei. The lecturer will be Bruce Shiau, the Senior Director of Technical Division EMC/RF, Chief Engineer Office, Product Testing and Certification, DEKRA East & South Asia.
Due to the development of vehicle electrification, smart drving and IoV, the related technologies also have continuous breakthroughs, such as the AI machine learning in processors, the power supply systems changed to 48V, the power devices using wide band-gap materials such as SiC, and radar sensors using the 77/79GHz millimeter wave band, the adoption of C-V2X technology communication, and the LiDAR sensors becoming solidfied. All these technologies bring the growth of semiconductor industry, and also lots of business opportunities to automotive electronics supply chain.
In addition, 5G will enhance the networking and autonomous performance of cars, and create better experiences for passengers in the car. It also increases the efficiency of transporation system in cities by strengthening the data transmission of vehicles to vehicles (V2V) and vehicles toinfrastructure (V2I).
This event will focus on the three important key technologies, vehicle electrification, smart drving and IoV, the latest developments of related technologies and solutions, as well as market trends and application developments.